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Overview

Prof Brian Tanner

Emeritus Professor

M.A., D.Phil., C.Phys., F.Inst.P, F.H.E.A., F.R.S.A.


Affiliations
AffiliationRoom numberTelephone
Emeritus Professor in the Department of Physics120+44 (0) 191 33 43518
Member of the Centre for Materials Physics120+44 (0) 191 33 43518
Member of the Centre for Molecular and Nanoscale Electronics  
Department Rep (Physics) of Institute of Medieval and Early Modern Studies  

Biography

Responsibilities within department

Having retired as Dean for University Enterprise, I am now an Emeritus Professor of Physics with no departmental responsibilities. Thus, I do not take new PhD students. I am fortunate to be granted office space in the Department from which to pursue continued academic activity

Teaching activity

I am retired but give occasional public talks.

Research interests

My research interests centre around the use of x-ray scattering to probe the structure of materials. I am particularly focused on the effect of strain on the mechanical and electronic properties of semiconductors and the relationship between structure and magnetic properties of thin film materials used for magnetic devices in the recording industry. Experiments are performed at the Diamond Light Source at Didcot near Oxford with collaborators from Dublin and Freiburg. In addition, I am a member of the interdisciplinary Ordered Universe project studying the scientific works of the 13th century polymath, Robert Grosseteste.

Recent peer-reviewed journal publications include:

X-ray imaging of silicon die within fully packaged semiconductor devices, B.K.Tanner, P.J.McNally and A.N.Danilewsky, Powder Diffraction 36 (2021) DOI: https://doi.org/10.1017/S088571562100021X

Magnifying grains of sand, seeds and blades of grass: Optical effects in Robert Grosseteste's De iride (On the rainbow) (circa 1228-1230), R.C.White, G.E.M.Gasper, T.C.B.McLeish, B.K.Tanner, J.S.Harvey, S.O.Sønnesyn, L.K.Young and H.E.Smithson, Isis 112 (2021) 93-107 https://www.journals.uchicago.edu/doi/10.1086/713724

'The moon quivered like a snake': A medieval chronicler, lunar explosions and a puzzle for modern interpretation, G.E.M.Gasper and B.K.Tanner, Endeavour 44 (2020) 100750 http://dx.doi.org/10.1016/j.endeavour.2021.100750

Emeritus Professor Brian Tanner moved to Durham in 1973 as a University Lecturer, after holding a Junior Research Fellowship at Linacre College, Oxford. Promoted to Senior Lecturer in 1983, Reader in 1986 and Professor in 1990, he served as Head of Durham University Physics Department from 1996-1999. From 1999-2000 he held a Sir James Knott Foundation Fellowship and from 2000-2001 he was a Leverhulme Research Fellow. From 2000 part of his time was spent as Director of the North East Centre for Scientific Enterprise and subsequently as the Director of the University Technology Transfer Office. From 2008-2012 he was Dean of Knowledge Transfer in Durham University and from 2012 until his retirement in 2016 was its Dean for University Enterprise. He has served on numerous Research Council committees and panels, and from 1998-2000 was chairman of a scientific review committee at the European Synchrotron Radiation Facility in Grenoble.

In 1978 he co-founded a spin-off company, Bede Scientific Instruments Ltd that floated on the London Stock Exchange in November 2000 as Bede plc. It was acquired by Jordan Valley Semiconductors in 2008, still currently employing 30 people on Belmont Business Park, Durham. From 2003 until 2015, Professor Tanner was a non-executive director of another spin-out from Durham which has become the Kromek Group plc, floating on the London Stock Exchange AIM market in October 2013.

He has published over 400 papers in refereed international scientific journals, written 2 books, co-authored 3 books and edited 3 books. His current research interests lie in understanding the relationship between magnetic, optical and structural properties of advanced materials, making particular use of high resolution X-ray scattering. He is a Fellow of the Institute of Physics and a Fellow of the Royal Society of Arts. In 2005 he was jointly awarded Barrett Award of the Pennsylvania-based International Center for Diffraction Data and in 2012 he received the Queen’s Award for Enterprise Promotion. He received the Gabor Prize and Medal of the Institute of Physics in 2014.

Outside of the University, he has been Chair of the County Durham Economic Partnership (2012-2020). He is an enthusiastic amateur musician, being organist at Elvet Methodist Church, Durham and a double bass player with the New Tyneside Orchestra.

Research interests

  • X-ray scattering and magnetism
  • semiconductors and ceramics
  • metallic multilayers
  • Medieval science

Research groups

Research Projects

  • Durham - CMI Knowledge Exchange Laboratory, The
  • Hunter 100

Related Links

Esteem Indicators

  • : 2005 Barrett Award of the International Centre for Diffraction Data, Pennsylvania, USA

    2012 Queen's Award for Enterprise promotion

    2014 Gabor (formerly Duddell) Medal and Prize of the Institute of Physics ;

Media Contacts

Available for media contact about:

  • Industry & University: academic/industrial development
  • Industry & University: co-founder, Bede Scientific Instruments Ltd, now Bede plc
  • Technology transfer: academic/industrial development
  • Technology transfer: co-founder, Bede Scientific Instruments Ltd, now Bede plc
  • Industry: Chemicals, plastics, oil & gas: academic/industrial development
  • Industry: Chemicals, plastics, oil & gas: co-founder, Bede Scientific Instruments Ltd
  • Music: physics of (and) music
  • Science: Education, industry & the community: academic/industrial development
  • Science: Education, industry & the community: co-founder, Bede Scientific Instruments Ltd, now Bede plc
  • Atomic particles: Basic matter: physics of materials
  • Atomic particles: Basic matter: ionizing radiation
  • Industrial materials: physics of materials
  • Industrial materials: ionizing radiation

Publications

Chapter in book

  • Tanner, BK & Tanner, RE (2020). The legacy of Robert Grosseteste and the teaching of experimental physics to 14-16 year-olds in England. In Robert Grosseteste and the theory of learning: The ordered human. Cunningham, J & Puttick, S Routledge. 118-141.
  • Thomson D & Tanner BK (2019). The seven liberal arts: Commentary and Analysis. In Knowing and speaking: Robert Grosseteste's De artibus liberalibus 'On the liberal arts' and De generatione sonorum 'On the generation of sounds'. Gasper, GEM, Panti, C, McLeish TCBM & Smithson, HE Oxford University Press. 1: 448-482.
  • Tanner, Brian K. (2018). Grazing Incidence X-Ray Reflectivity and Scattering. In Handbook of Advanced Non-Destructive Evaluation. Ida, Nathan & Meyendorf, Norbert. Springer. 1-16.
  • Tanner, B.K. Bower, R.G, McLeish, T.C.B. & Gasper, G.E.M. (2016). Unity and Symmetry in the De Luce of Robert Grosseteste. In Robert Grosseteste and the pursuit of Scientific Learning in the Middle-Ages. Cunningham, J.P. & Hocknull, M.D. Springer. 3-20.
  • Tanner, B K (2016). X-ray Scattering from Spintronic Structures. In Handbook of Spintronics. Yongbing Xu, David D. Awschalom & Junsaku Nitta Springer Netherlands. 919-945.
  • Niedoba H, Mirecki B, Thompson S, Whiting JSS, Ganot F, Hase TP, Pape I & Tanner BK (1997). Magnetization Process In Co/cr/co Trilayers With Ferro- And Antiferromagnetic Interlayer Coupling. In Magnetic hysteresis in novel magnetic materials. Hadjipanayis, George C. DORDRECHT: KLUWER ACADEMIC PUBL. 338: 549-553.
  • Lafford T, Loxley N & Tanner BK (1997). High Resolution X-ray Diffraction From Epitaxial Gallium Nitride Films. In III-V Nitrides. Ponce, F.A., Moustakas, T.D., Akasaki, I. & Monemar, B.A. WARRENDALE: MATERIALS RESEARCH SOCIETY. 449: 483-488.
  • Tanner BK (1996). Contrast Of Defects In X-ray Diffraction Topographs. In X-Ray and Neutron Dynamical Diffraction, Theory and Applications. Authier, André, Lagomarsino, Stefano & Tanner, Brian K. NEW YORK: PLENUM PRESS DIV PLENUM PUBLISHING CORP. 357: 147-166.
  • Makar JM & Tanner BK (1996). The Effect Of Carbon Content On The Magnetisation Of Steel. In Nonlinear Electromagnetic Systems. Moses, A.J. & Basak, Amitava AMSTERDAM: I O S PRESS. 10: 472-475.
  • Watson CCR, Durose K, Okeefe E, Hudson JM & Tanner BK (1995). Dislocation Distributions In Cd1-xhgxte/cdte And Cd(1-x) Hgxte/cd1-yznyte Grown By Liquid Phase Epitaxy. In Thin Films: Stresses and Mechanical Properties V. Baker, SP, Ross, CA, Townsend, PH, Volkert, CA & Borgesen, P PITTSBURGH: MATERIALS RESEARCH SOC. 356: 301-306.

Conference Paper

  • Guo,J., Yang, Y., Raghothamachar, B., Dudley, M., Welt, S,, Danilewsky, A,N,, McNally, P.J. & Tanner, B.K. (2018), Direct observation of stress relaxation process in 4H-SiC homoepitaxial layers via in-situ synchrotron X-ray topography, in Stahlbush, R., Neudeck, P., Bhalla, A., Devaty, R.P., Dudley, M. & Lelis, A eds, Materials Science Forum 924: 2017 International Conference on Silicon Carbide and Related Materials. Washington DC, Scientific.net, 176-179.
  • Yang, Y., Guo, J., Raghothamachar, B., Dudley, M., Welt, S. Danilewsky, A,N., McNally, P.J. & Tanner, B.K. (2018), In-situ synchrotron X-ray topography observation of double-ended Frank-Read sources in PVT-grown 4H-SiC wafers, in Stahlbush, R., Neudeck, P., Bhalla, A., Devaty, R.P., Dudley, M. & Lelis, A. eds, Materials Science Forum 924: 2017 International Conference on Silicon Carbide and Related Materials. Washington DC, Scientific.net, 172-175.
  • Gorji, N. E., Tanner, B. K., Vijayaraghavan, R. K., Danilewsky, A. N. & McNally, P. J. (2017), Nondestructive, In Situ Mapping of Die Surface Displacements in Encapsulated IC Chip Packages Using X-Ray Diffraction Imaging Techniques, 2017 IEEE 67th Electronic Components and Technology Conference (ECTC). IEEE, 520-525.

Conference Proceeding

  • Lafford TA, Parbrook PJ & Tanner BK (2002). Direct, Independent Measurement Of Twist And Tilt Mosaic As A Function Of Thickness In Epitaxial Gan. International Workshop on Nitride Semiconductors (IWN 2002), Aachen, Germany, WILEY-V C H VERLAG GMBH.
  • Cockerton S, Cooke ML, Bowen DK & Tanner BK (1996). Combined Room Temperature Photoluminescence And High Resolution X-ray Diffraction Mapping Of Semiconductor Wafers. Symposium on Diagnostic Techniques for Semiconductor Materials Processing II, Boston, MATERIALS RESEARCH SOC.
  • Wormington M, Sakurai K, Bowen DK & Tanner BK (1994). Grazing Incidence X-ray Reflectance Measurement Of Surface And Interface Roughness On The Sub-nanometre Scale. Symposium on Determining Nanoscale Physical Properties of Materials by Microscopy and Spectroscopy, Boston, Materials Research Society.
  • Loxley N, Cockerton S, Cooke LM, Gray T, Tanner BK & Bowen DK (1994). New Algorithms For Rapid Full-wafer Mapping By High-resolution Double Axis X-ray-diffraction. Symposium on Diagnostic Techniques for Semiconductor Materials Processing, Boston, MATERIALS RESEARCH SOC.
  • Loxley N, Monteiro A, Cooke ML, Bowen DK & Tanner BK (1992). A Grazing-incidence X-ray Reflectometer For Rapid Nondestructive Characterization Of Thin-films And Interfaces. Symposium of Advanced III-V Compound Semiconductor Growth, Processing and Device, Boston, Materials Research Society.

Journal Article

  • White, Rebekah C., Gasper, Giles E. M., McLeish, Tom C. B., Tanner, Brian K., Harvey, Joshua S., Sønnesyn, Sigbjørn O., Young, Laura K. & Smithson, Hannah E. (2021). Magnifying Grains of Sand, Seeds, and Blades of Grass: Optical Effects in Robert Grosseteste’s De iride (On the Rainbow) (circa 1228–1230). Isis 112(1): 93-107.
  • Tanner, Brian K., McNally, Patrick J. & Danilewsky, Andreas N. (2021). X-ray imaging of silicon die within fully packaged semiconductor devices. Powder Diffraction 36(2): 78-84.
  • Tanner, B.K., Vijayaraghavan, R.K., Roarty, B., Danilewsky, A.N. & McNally, P.J. (2019). In-Operando X-ray diffraction imaging of thermal strains in fully packaged silicon devices. Microelectronics Reliability 99: 232-238.
  • Mullins, J. T., Dierre, F., Halliday, D. P., Tanner, B. K., Radley, I., Kang, Z. & Summers, C. J. (2017). Structural and optical properties of oxygen doped single crystal ZnTe grown by multi-tube physical vapour transport. Journal of Materials Science: Materials in Electronics 28(16): 11950-11960.
  • Tanner, Brian, Allen, David, Wittge, Jochen, Danilewsky, Andreas, Garagorri, Jorge, Gorostegui-Colinas, Eider, Elizalde, M. & McNally, Patrick (2017). Quantitative Imaging of the Stress/Strain Fields and Generation of Macroscopic Cracks from Indents in Silicon. Crystals 7(11): 347.
  • Tanner, B. K., Danilewsky, A. N., Vijayaraghavan, R. K., Cowley, A. & McNally, P. J. (2017). Nondestructive X-ray diffraction measurement of warpage in silicon dies embedded in integrated circuit packages. Journal of Applied Crystallography 50(2): 547-554.
  • Harvey, Joshua, Smithson, Hannah, Siviour, Clive, Gasper, Giles E. M., Sonnesyn, Sigbjorn O., Tanner, Brian K. & McLeish, Tom (2017). Bow-shaped Caustics from Conical Prisms: a 13th Century Account of Rainbow Formation from Robert Grosseteste’s De iride. Applied Optics 56(19): G197-G204.
  • Bose, A.K., Vijayaraghavan, R.K., Cowley, A., Cherman, V., Tanner, B.K., Danilewsky, A.N., De Wolf, I. & McNally, P.J. (2016). Nondestructive Monitoring of Die Warpage in Encapsulated Chip Packages. IEEE Transactions on Components, Packaging and Manufacturing Technology 6(4): 653-662.
  • Tanner, B.K. (2016). Cracks observed to propagate discontinuously on the millisecond timescale. IUCrJ 3(2): 86-87.
  • Tanner, B.K., Garagorri, J., Gorostegui-Colinas, E., Elizalde, M.R. Allen, D.M., McNally, P.J., Wittge, J., Ehlers, C. & Danilewsky, A.N. (2016). X-ray asterism and the structure of cracks from indentations in silicon. Journal of Applied Crystallography 49(1): 250-259.
  • Tanner, B.K., Mullins, J.T., Pym, A.T.G. & Maneuski, D. (2016). Twinning in vapour-grown, large volume Cd1-xZnxTe crystals. Journal of Crystal Growth 448: 44-50.
  • Mullins JT, Dierre F & Tanner BK (2015). X-ray Diffraction Imaging of ZnTe Crystals Grown by the Multi-Tube Physical Vapour Transport Technique. Journal of Crystal Growth 413: 61-66.
  • Tanner, B. K., Garagorri, J., Gorostegui-Colinas, E., Elizalde, M. R., Bytheway, R., McNally, P. J. & Danilewsky, A. N. (2015). The Geometry of Catastrophic Fracture during High Temperature Processing of Silicon. International Journal of Fracture 195(1-2): 79-85.
  • Bower, R.G., McLeish, T.C.B., Tanner, B.K., Smithson, H.E., Panti, C., Lewis, N. & Gasper, G.E.M. (2014). A medieval multiverse?: Mathematical modelling of the thirteenth century universe of Robert Grosseteste. Proceedings of the Royal Society A 470(2167): 40025.
  • Smithson, Hannah, Anderson, Philip, Dinkova-Bruun, Greti, Gasper, Giles, Laven, Philip, McLeish, Tom, Panti, Cecilia & Tanner, Brian (2014). Color-coordinate system from a 13th-century account of rainbows. Journal of the Optical Society of America A 31(4): A341-A349.
  • McLeish, Tom C.B., Bower, Richard G., Tanner, Brian K., Smithson, Hannah E., Panti, Cecilia, Lewis, Neil & Gasper, Giles E. M. (2014). History: A medieval multiverse. Nature 507(7491): 161-163.
  • Eastwood DS, Ali M, Hickey BJ & Tanner BK (2013). In-situ grazing incidence x-ray diffraction measurements of relaxation in Fe/MgO/Fe epitaxial magnetic tunnel junctions during annealing. Journal of Magnetism and Magnetic Materials 348: 128-131.
  • B K Tanner, J Wittge P Vagovič T Baumbach D Allen P J McNally R Bytheway D Jacques M C Fossati, D K Bowen J Garagorri M R Elizalde & A N Danilewsky (2013). X-ray diffraction imaging for predictive metrology of crack propagation in 450-mm diameter silicon wafers. Powder Diffraction 28(02): 95-99.
  • Danilewsky A.N., Wittge J. Kiefl K., Allen D., McNally P.J. Garagorri J. Elizalde M.R. Baumbach T. & Tanner B.K. (2013). Crack propagation and fracture in silicon wafers under thermal stress. Journal of Applied Crystallography 46(4): 849-855.
  • Garagorri, J, Elizalde, MR Fossati, MC Jacques, D & Tanner, BK (2012). Slip band distribution in rapid thermally annealed silicon wafers. Journal of Applied Physics 111(9): 094901.
  • Tanner, BK, Fossati, MC Garagorri, J Elizalde, MR Allen, D McNally, PJ Jacques, D Wittge, J & Danilewsky, AN (2012). Prediction of the propagation probability of individual cracks in brittle single crystal materials. Applied Physics Letters 101(4): 041903.
  • Choubey, A Veeramani, P Pym, ATG Mullins, JT Sellin, PJ Brinkman, AW Radley, I Basu, A & Tanner, BK (2012). Growth by the Multi-tube Physical Vapour Transport method and characterisation of bulk (Cd,Zn)Te. Journal of Crystal Growth 352(1): 120-123.
  • Morley, NA, Dhandapani, D, Rao, A, Al Qahtani, H, Gibbs, MRJ, Grell, M, Eastwood, D & Tanner, BK (2011). Polymeric spin-valves at room temperature. Synthetic Metals 161(7-8): 558-562.
  • Danilewsky, AN, Wittge, J, Croell, A, Allen, D, McNally, P, Vagovic, P, Rolo, TD, Li, Z, Baumbach, T, Gorostegui-Colinas, E, Garagorri, J, Elizalde, MR, Fossati, MC, Bowen, DK & Tanner, BK (2011). Dislocation dynamics and slip band formation in silicon: In-situ study by X-ray diffraction imaging. Journal Of Crystal Growth 318(1): 1157-1163.
  • Danilewsky, AN Wittge, J Hess, A Croll, A Rack, A Allen, D McNally, P Rolo, TD Vagovic, P, Baumbach, T Garagorri, J Elizalde, MR & Tanner, BK (2011). Real-time X-ray diffraction imaging for semiconductor wafer metrology and high temperature in situ experiments. physica status solidi (a) 208(11): 2499-2504
  • Tanner, BK, Wittge, J, Allen, D, Fossati, MC, Danilwesky, AN, McNally, P, Garagorri, J, Elizalde, MR & Jacques, D (2011). Thermal slip sources at the extremity and bevel edge of silicon wafers. Journal Of Applied Crystallography 44(3): 489-494.
  • Wittge, J, Danilewsky, A, Allen, D, McNally, P, Li, ZJ, Baumbach, T, Gorostegui-Colinas, E, Garagorri, J, Elizalde, MR, Jacques, D, Fossati, MC, Bowen, DK & Tanner, BK (2010). X-ray diffraction imaging of dislocation generation related to microcracks in Si wafers. Powder Diffraction 25(2): 99-103.
  • Wittge, J, Danilewsky, AN, Allen, D, McNally, P, Li, Z, Baumbach, T, Gorostegui-Colinas, E, Garagorri, J, Elizalde, MR, Jacques, D, Fossati, MC, Bowen, DK & Tanner, BK (2010). Dislocation sources and slip band nucleation from indents on silicon wafers. Journal Of Applied Crystallography 43(5): 1036-1039.
  • Abes, M, Atkinson, D, Tanner, BK, Charlton, TR, Langridge, S, Hase, TPA, Ali, M, Marrows, CH, Hickey, BJ, Neudert, A, Hicken, RJ, Arena, D, Wilkins, SB, Mirone, A & Lebegue, S (2010). Spin polarization and exchange coupling of Cu and Mn atoms in paramagnetic CuMn diluted alloys induced by a Co layer. Physical Review B 82(18): 184412.
  • Pym, ATG, Ruhrig, M & Tanner, BK (2010). Layer and interface structural changes in Co0.6Fe0.2B0.2/AlOx multilayers on annealing. Journal Of Applied Physics 107(9): 093524
  • Fan, R, Kinane, CJ, Charlton, TR, Dorner, R, Ali, M, de Vries, MA, Brydson, RMD, Marrows, CH, Hickey, BJ, Arena, DA, Tanner, BK, Nisbet, G & Langridge, S (2010). Ferromagnetism at the interfaces of antiferromagnetic FeRh epilayers. Physical Review B 82(18): 184418
  • Abes, M, Atkinson, D, Tanner, BK, Charlton, T, Langridge, S, Hase, TPA, Ali, M, Marrows, CH, Neudert, A, Hicken, RJ, Mirone, A & Arena, D (2009). The spin polarization of Mn atoms in paramagnetic CuMn alloys induced by a Co layer. Journal Of Applied Physics 105(7): 07C703.
  • Q. Jiang, D.P. Halliday, B.K. Tanner, A.W. Brinkman, B.J. Cantwell, J.T. Mullins & A. Basu (2009). Thick epitaxial CdTe films grown by close space sublimation on Ge substrates. Journal of Physics D: Applied Physics 42(1): 012004.
  • Mullins, JT, Cantwell, BJ, Basu, A, Jiang, Q, Choubey, A, Brinkman, AW & Tanner, BK (2008). Vapor-phase growth of bulk crystals of cadmium telluride and cadmium zinc telluride on gallium arsenide seeds. Journal Of Electronic Materials 37(9): 1460-1464.
  • Andres, JP, Gonzalez, JA, Hase, TPA, Tanner, BK & Riveiro, JM (2008). Artificial ferrimagnetic structure and thermal hysteresis in Gd0.47Co0.53/Co multilayers. Physical Review B 77(14): 7.
  • Eastwood, DS, Egelhoff, WF & Tanner, BK (2008). The Role of Preoxidation on the Interface Structure of Co/MgO Multilayers. Ieee Transactions On Magnetics 44(11): 3594-3596.
  • Bilzer, C, Devolder, T, Chappert, C, Plantevin, O, Suszka, AK, Hickey, BJ, Lamperti, A, Tanner, BK, Mahrov, B & Demokritov, SO (2008). Ferromagnetic resonance linewidth reduction in Fe/Au multilayers using ion beams. Journal Of Applied Physics 103(7): 07B518.
  • Pym, A. T. G. Lamperti, A. Cardoso, S., Freitas, P. P. & Tanner, B. K. (2007). Interface stability in CoFe and CoFeB based multilayers. Superlattices and Microstructures 41: 122-126.
  • Kruglyak, VV, Hicken, RJ, Srivastava, GP, Ali, M, Hickey, BJ, Pym, ATG & Tanner, BK (2007). Optical excitation of a coherent transverse optical phonon in a polycrystalline Zr metal film. Physical Review B 76(1): 4.
  • Lamperti, A, Pym, ATG, Eastwood, DS, Cardoso, S, Wisniowski, P, Freitas, PP, Anderson, GIR, Marrows, CH & Tanner, BK (2007). Interface stability of magnetic tunnel barriers and electrodes. Physica Status Solidi A-applications And Materials Science 204(8): 2778-2784.
  • Vaz, CAF, Lauhoff, G, Bland, JAC, Langridge, S, Bucknall, DG, Penfold, J, Clarke, J, Halder, SK & Tanner, BK (2007). Interface dependent magnetic moments in Cu/Co,Ni/Cu/Si(001) epitaxial structures. Journal Of Magnetism And Magnetic Materials 313(1): 89-97.
  • Suszka, AK, Kinane, CJ, Marrows, CH, Hickey, BJ, Arena, DA, Dvorak, J, Lamperti, A, Tanner, BK & Langridge, S (2007). Element specific separation of bulk and interfacial magnetic hysteresis loops. Applied Physics Letters 91(13): 3.
  • Pym, ATG, Lamperti, A, Cardoso, S, Freitas, PP & Tanner, BK (2007). Layer and interface structure of CoFe/Ru multilayers. Acta Physica Polonica A 112(6): 1243-1248.
  • Hase, T.P.A., van Kampen, M., Bručas, R., Hjörvarsson, B. Atkinson, D. & Tanner, B. K. (2007). X-ray scattering from two-dimensionally patterned magnetic thin film nanoscale arrays. Superlattices and Microstructures 41: 163-167.
  • Rozatian, ASH, Hase, TPA, Tanner, BK, Ryan, PA, Dekadjevi, DT & Hickey, BJ (2007). Grazing incidence X-ray scattering from epitaxial Fe/Au multilayers. Physica Status Solidi A-applications And Materials Science 204(8): 2626-2632.
  • Tanner, B.K., Wu, H.Z. & Roberts, S.G. (2006). High-Resolution Parallel-Beam Powder Diffraction Measurement of Sub-Surface Damage in Alumina-silicon carbide nanocomposite. Advances in X-ray Analysis 49: 169-174.
  • Pym, A. T. G., Lamperti, A., Tanner, B. K., Dimopoulos, T., Ruhrig, M. & Wecker, J. (2006). Interface sharpening in CoFeB magnetic tunnel junctions. Applied Physics Letters 88(16): 162505.
  • Tanner, BK, Wu, HZ & Roberts, SG (2006). Sub-surface damage in ground and annealed alumina and alumina-siliconcarbide nanocomposites. Journal Of The American Ceramic Society 89(12): 3745-3750.
  • H. L. Nguyen, L. E. M. Howard, G. W. Stinton, S. R. Giblin, B. K. Tanner, I. Terry, A. K. Hughes, I. M. Ross, A. Serres & J. S. O. Evans (2006). Synthesis of size controlled fcc and fct FePt nanoparticles. Chemistry of Materials 18(26): 6414-6418.
  • Kelly K.L. & Tanner B.K. (2006). Factors affecting in-line phase-contrast imaging with a laboratory micro-focus x-ray source. Advances in X-ray Analysis 49: 31-36.
  • Kruglyak, V. V., Hicken, R. J., Ali, M., Hickey, B. J., & Pym, A. T. and Tanner, B. K. (2005). Measurement of hot electron momentum relaxation times in metals by femtosecond ellipsometry. Physical Review B 71: 233104-.
  • Pym, A. T. G., Rozatian, A. S. H., Marrows, C. H., Brown, & S. D., Bouchenoire, L., Hase, T. P. A. and Tanner, B. K. (2005). The in-plane length scale of the conformal interface roughness as a function of bilayer repeat number in Co/Pd multilayers. Journal of Physics D Applied Physics 38: A190-A194.
  • Rozatian, A. S. H., Marrows, C. H., Hase, T. P. A. and & Tanner, B. K. (2005). The relationship between interface structure, conformality and perpendicular anisotropy in CoPd multilayers. Journal of the Physics of Condensed Matter 17: 3759-3770.
  • Nguyen, HL, Howard, LEM, Giblin, SR, Tanner, BK, Terry, I, Hughes, AK, Ross, IM, Serres, A, Burckstummer, H & Evans, JSO (2005). Synthesis of monodispersed fcc and fct FePt/FePd nanoparticles bymicrowave irradiation. Journal Of Materials Chemistry 15(48): 5136-5143.
  • Dekadjevi, D. T., Hickey, B. J., Brown, S., Hase, T. P., & Fulthorpe, B. D. and Tanner, B. K. (2005). Structural phase transition of Fe grown on Au(111). Physical Review B 71: 054108-.
  • Tanner, B. K., Wu, H. Z. & Roberts, S. G. (2005). Direct evidence for compressive elastic strain at ground surfaces of nanocomposite ceramics. Applied Physics Letters 86(6): 061909.
  • Pym, A. T. G., Rozatian, A. S. H., Marrows, C. H., Hickey, & B. J., Hase, T. P. A. and Tanner, B. K. (2005). The out-of-plane correlation length of the conformal roughness in Co-Pd multilayers. Physica B Condensed Matter 357: 170-174.
  • Kruglyak, V. V., Hicken, R. J., Ali, M., Hickey, B. J., & Pym, A. T. G. and Tanner, B. K. (2005). Ultrafast third-order optical nonlinearity of noble and transition metal thin films. Journal of Optics A: Pure and Applied Optics 7: 235-.
  • Howard, L. E. M. Nguyen, H. L. Giblin, S. R., Tanner, B. K. Terry, I. Hughes, A. K. & Evans, J. S. O. (2005). A synthetic route to size-controlled fcc and fct FePt nanoparticles. Journal of the American Chemical Society 127(29): 10140-10141.
  • Tanner BK, Wu HZ, Roberts SG & Hase TPA (2004). Subsurface Damage In Alumina And Alumina-silicon Carbide Nanocomposites. Philosophical Magazine 84: 1219-1232.
  • Tanner BK, Hase TPA, Lafford TA & Goorsky MS (2004). Grazing Incidence In-plane X-ray Diffraction In The Laboratory. Powder Diffraction 19: 45-48.
  • Wu, X. S., Cai, H. L., Xu, J., Tan, W. S., Hu, A., Jiang, & S. S., Hase, T. P. A., Tanner, B. K. and Xiong, G. (2004). Substrate and thickness effects on structure and transport properties of La2/3Ca1/3MnO3 films. Journal of Applied Physics 95: 7109-7111.
  • Wilks, R., Hicken, R. J., Ali, M., Hickey, B. J., & Buchanan, J. D. R., Pym, A. T. G. and Tanner, B. K. (2004). Investigation of ultrafast demagnetization and cubic optical nonlinearity of Ni in the polar geometry. Journal of Applied Physics 95: 7441-7443.
  • Wu, X. S., Hase, T. P. A., Tanner, B. K. and Cheng, H. H. (2004). Grazing incidence X-ray scattering from Ge/Si superlattices grown at low temperature. Surface Science 548: 239-245.
  • Cole, A., Hickey, B. J., Hase, T. P. A., Buchanan, J. D. & R. and Tanner, B. K. (2004). Influence of the interfacial roughness on electron channelling in Fe/Au(001) multilayers. Journal of the Physics of Condensed Matter 16: 1197-1209.
  • Buchanan, J. D. R., Hase, T. P. A., Tanner, B. K., Powell, & C. J. and Egelhoff, W. F., Jr. (2004). Interface intermixing and in-plane grain size in aluminum transition-metal bilayers. Journal of Applied Physics 96: 7278-7282.
  • Rozatian, A. S. H., Fulthorpe, B. D., Hase, T. P. A., Read, D. E., Ashcroft, G., Joyce, D. E., Grundy, P. J., Amighian, J. and & Tanner, B. K. (2003). Anisotropy and interface structure in sputtered Co/Pt multilayers on Si. Journal of Magnetism and Magnetic Materials 256: 365-372.
  • Lafford, T. A., Parbrook, P. J. & Tanner, B. K. (2003). Influence of alloy composition and interlayer thickness on twist and tilt mosaic in AlxGa1-xN/AlN/GaN heterostructures. Applied Physics Letters 83(26): 5434-5436.
  • Buchanan, J. D. R., Hase, T. P. A., Tanner, B. K., Chen, & P. J., Gan, L., Powell, C. J. and Egelhoff, W. F. (2003). Intermixing of aluminum-magnetic transition-metal bilayers. Journal of Applied Physics 93: 8044-8046.
  • Hase, T. P. A., Ho, E. M., Freijo, J.-J., Thompson, S. M., & Petford-Long, A. K. and Tanner, B. K. (2003). Comparison of interface structure of thin miscible films by grazing incidence x-ray scattering and high-resolution electron microscopy. Journal of Physics D Applied Physics 36: A231-A235.
  • Lafford, T. A., Tanner, B. K. and Parbrook, P. J. (2003). Direct measurement of twist mosaic in GaN epitaxial films as a function of growth temperature. Journal of Physics D Applied Physics 36: A245-A248.
  • Hase, T. P. A., Buchanan, J. D. R., Tanner, B. K., Langridge, S., Dalgliesh, R. M., Foster, S., Marrows, C. H. & Hickey, B. J. (2003). Resonant magnetic x-ray and neutron diffuse studies of transition metal multilayers. Journal of Applied Physics 93(10): 6510-6512.
  • Lafford, T. A., Ryan, P. A., Joyce, D. E., Goorsky, M. S. & Tanner, B. K. (2003). Direct measurement of twist mosaic in epitaxial GaN. physica status solidi (a) 195(1): 265-270.
  • González, J. A., Andrés, J. P., López de La Torre, M. A., & Riveiro, J. M., Hase, T. P. A. and Tanner, B. K. (2003). X-ray study of the interdiffusion and interfacial structure in ferrimagnetic Gd1-xCox/Co multilayers. Journal of Applied Physics 93: 7247-7249.
  • Tanner, B. K., Parbrook, P. J., Lunn, B., Hogg, J. H. C., & Keir, A. M. and Johnson, A. D. (2003). Observation of hardening during relaxation of InGaAs on GaAs. Journal of Physics D Applied Physics 36: A198-A201.
  • Clarke, J., Pape, I., Normile, P. and Tanner, B. K. (2003). X-ray scattering from uniform and patterned indium tin oxide thin films. Journal of Physics D Applied Physics 36: A209-A213.
  • Georgieva, M. T., Telling, N. D., Jones, G. A., Grundy, P. & J., Hase, T. P. A. and Tanner, B. K. (2003). Spin-valve magnetization reversal obtained by N-doping in Fe/insulator/Fe trilayers. Journal of the Physics of Condensed Matter 15: 617-624.
  • Mai, Z. H., Luo, G. M., Liu, C. X., Li, M. H., Jiang, H. W., Lai, W. Y., Wang, J., Ding, Y. F., Hase, T. P. A., Fulthorpe, B. D., & and Tanner, B. K. (2003). Structural and chemical diagnosis of magnetic multilayers by RAFS and XRF techniques. Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and 199: 494-498.
  • Wilkins, SB, Spencer, PD, Hatton, PD, Tanner, BK, Lafford, TA, Spence, J & Loxley, N (2002). Novel diffractometer optimized for the study of weak superlattice reflections using crossed parabolic mirrors. Review Of Scientific Instruments 73(7): 2666-2671.
  • Goorsky MS & Tanner BK (2002). Grazing Incidence In-plane Diffraction Measurement Of In-plane Mosaic With Microfocus X-ray Tubes. Crystal Research And Technology 37: 645-653.
  • Buchanan, J. D. R., Hase, T. P. A., Tanner, B. K., Hughes, N. D. & Hicken, R. J. (2002). Determination of the thickness of Al2O3 barriers in magnetic tunnel junctions. Applied Physics Letters 81(4): 751-753.
  • Beghi MG, Bottani CE, Bassi AL, Ossi PM, Tanner BK, Ferrari AC & Robertson J (2002). Measurement Of The Elastic Constants Of Nanometer-thick Films. Materials Science & Engineering C-biomimetic And Supramolecular Systems 19: 201-204.
  • Buchanan, J. D., Hase, T. P., Tanner, B. K., Chen, P. J., & Gan, L., Powell, C. J. and Egelhoff, W. F. (2002). Anomalously large intermixing in aluminum-transition-metal bilayers. Physical Review B 66: 104427-.
  • Beghi, M. G., Ferrari, A. C., Teo, K. B. K., Robertson, & J., Bottani, C. E., Libassi, A. and Tanner, B. K. (2002). Bonding and mechanical properties of ultrathin diamond-like carbon films. Applied Physics Letters 81: 3804-3806.
  • Beghi MG, Ferrari AC, Bottani CE, Libassi A, Tanner BK, Teo KBK & Robertson J (2002). Elastic Constants And Structural Properties Of Nanometre-thick Diamond-like Carbon Films. Diamond And Related Materials 11: 1062-1067.
  • Luo, G. M., Mai, Z. H., Hase, T. P. A., Fulthorpe, B. D., & Tanner, B. K., Marrows, C. H. and Hickey, B. J. (2001). Variable wavelength grazing incidence x-ray reflectivity measurements of structural changes on annealing Cu/NiFe multilayers. Physical Review B 64: 245404-.
  • Dekadjevi, D. T., Ryan, P. A. Fulthorpe, B. D., Hickey, B. J. & Tanner, B. K. (2001). Experimental evidence for electron channeling in Fe /Au (100) superlattices. Physical Review Letters 86(25): 5787-5790.
  • Tanner BK, Hase TPA & Wu HZ (2001). Determination Of The Depth Distribution Of Subsurface Damage During Polishing Of Alumina. Philosophical Magazine Letters 81: 351-355.
  • Tanner, B. K., Parbrook, P. J., Whitehouse, C. R., Keir, A. M., Johnson, A. D., Jones, J., Wallis, D., Smith, L. M., Lunn, B. and & Hogg, J. H. C. (2001). In situ x-ray topography measurement of the growth temperature dependence of the critical thickness of epitaxial InGaAs on GaAs. Journal of Physics D Applied Physics 34: A109-A113.
  • Vaz, C. A. F., Lauhoff, G., Bland, J. A. C., Fulthorpe, B. & D., Hase, T. P. A., Tanner, B. K., Langridge, S. and Penfold, J. (2001). Effect of the Cu capping thickness on the magnetic properties of thin Ni/Cu(001) films. Journal of Magnetism and Magnetic Materials 226: 1618-1620.
  • Beghi MG, Bottani CE, Bassi AL, Tanner BK, Ferrari AC, Teo KBK & Robertson J (2001). Measurement Of The Elastic Constants Of Nanometric Films. Optical Metrology Roadmap For The Semiconductor, Optical, And Data Storage Industries Ii 4449: 119-130.
  • Tanner BK, Allwood DA & Mason NJ (2001). Kinetics Of Native Oxide Film Growth On Epiready Gaas. Materials Science And Engineering B-solid State Materials For Advanced Technology 80: 99-103.
  • Fulthorpe, B. D., Ryan, P. A., Hase, T. P. A., Tanner, B. & K. and Hickey, B. J. (2001). High-resolution x-ray diffraction studies of roughness and mosaic defects in epitaxial Fe/Au multilayers. Journal of Physics D Applied Physics 34: A203-A207.
  • Luo, G. M., Mai, Z. H., Hase, T. P. A., Fulthorpe, B. D., & Tanner, B. K., Marrows, C. H. and Hickey, B. J. (2001). X-ray reflection anomalous fine structure analysis of the stability of permalloy/copper multilayers. Journal of Magnetism and Magnetic Materials 226: 1728-1729.
  • Fulthorpe, B. D., Hase, T. P. A., Tanner, B. K., Marrows, & C. H. and Hickey, B. J. (2001). Structural and magnetic changes on annealing permalloy/copper multilayers. Journal of Magnetism and Magnetic Materials 226: 1733-1734.
  • Bottani CE, Bassi AL, Tanner BK, Stella A, Tognini P, Cheyssac P & Kofman R (2001). Brillouin Scattering Investigation Of Melting In Sn Nanoparticles. Materials Science & Engineering C-biomimetic And Supramolecular Systems 15: 41-43.
  • Hase, T. P. A., Fulthorpe, B. D., Wilkins, S. B., Tanner, B. K. Marrows, C. H. & Hickey, B. J. (2001). Weak magnetic moment on IrMn exchange bias pinning layers. Applied Physics Letters 79(7): 985-987.
  • Hase, T. P. A., Fulthorpe, B. D., Wilkins, S. B., Tanner, & B. K., Marrows, C. H. and Hickey, B. J. (2001). Soft X-ray magnetic scattering study of rotational magnetisation processes in cobalt/copper multilayers. Journal of Magnetism and Magnetic Materials 226: 1717-1719.
  • Makar, J.M. & Tanner, B.K. (2000). The effect of plastic deformation and residual stress on the permeability and magnetostriction of steels. Journal of Magnetism and Magnetic Materials 222: 291-304.
  • Hase, T. P. A., Pape, I., Read, D. E., Tanner, B. K., Dürr, & H., Dudzik, E., van der Laan, G., Marrows, C. H. and Hickey, B. J. (2000). Soft x-ray magnetic scattering evidence for biquadratic coupling in Co/Cu multilayers. Physical Review B 61: 15331-15337.
  • Tanner, B. K., Parbrook, P. J., Whitehouse, C. R., Keir, A. M., Johnson, A. D., Jones, J., Wallis, D., Smith, L. M., Lunn, B. and & Hogg, J. H. C. (2000). Dependence of the critical thickness on Si doping of InGaAs on GaAs. Applied Physics Letters 77: 2156-2158.
  • Pape I, Lawrence CW, Warren PD, Roberts SG, Briggs GAD, Kolosov OV, Hey AW, Paines CF & Tanner BK (2000). Evaluation Of Polishing Damage In Alumina. Philosophical Magazine A-physics Of Condensed Matter Structure Defects And Mechanical Properties 80: 1913-1934.
  • Libassi A, Ferrari AC, Stolojan V, Tanner BK, Robertson J & Brown LM (2000). Density And Sp(3) Content In Diamond-like Carbon Films By X-ray Reflectivity And Electron Energy Loss Spectroscopy. Amorphous And Nanostructured Carbon 593: 293-298.
  • Ferrari, A. C., Libassi, A., Tanner, B. K., Stolojan, V., & Yuan, J., Brown, L. M., Rodil, S. E., Kleinsorge, B. and Robertson, J. (2000). Density, sp3 fraction, and cross-sectional structure of amorphous carbon films determined by x-ray reflectivity and electron energy-loss spectroscopy. Physical Review B 62: 11089-11103.
  • Allwood DA, Carline RT, Mason NJ, Pickering C, Tanner BK & Walker PJ (2000). Characterization Of Oxide Layers On Gaas Substrates. Thin Solid Films 364: 33-39.
  • Du, C.-H., Lin, W. J., Su, Y., Tanner, B. K., Hatton, P. & D., Casa, D., Keimer, B., Hill, J. P., Oglesby, C. S. and Hohl, H. (2000). X-ray scattering studies of 2H-NbSe2, a superconductor and charge density wave material, under high external magnetic fields. Journal of the Physics of Condensed Matter 12: 5361-5370.
  • Hase, T. P. A., Pape, I., Tanner, B. K., Dürr, H., Dudzik, & E., van der Laan, G., Marrows, C. H. and Hickey, B. J. (2000). Soft-x-ray resonant magnetic diffuse scattering from strongly coupled Cu/Co multilayers. Physical Review B 61: 3792-.
  • Marrows, C. H., Hickey, B. J., Herrmann, M., McVitie, S., Chapman, J. N., Ormston, M., Petford-Long, A. K., Hase, T. P. A. and & Tanner, B. K. (2000). Damage caused to interlayer coupling of magnetic multilayers by residual gases. Physical Review B 61: 4131-4140.
  • Li Bassi, A., Bottani, C. E., Tanner, B. K., Stella, A., & Tognini, P., Cheyssac, P. and Kofman, R. (2000). The origin of the redshift in Brillouin spectra of silica films containing tin nanoparticles. European Physical Journal C: Particles and Fields 18: 31-38.
  • Ferrari AC, Kleinsorge B, Adamopoulos G, Robertson J, Milne WI, Stolojan V, Brown LM, Libassi A & Tanner BK (2000). Determination Of Bonding In Amorphous Carbons By Electron Energy Loss Spectroscopy, Raman Scattering And X-ray Reflectivity. Journal Of Non-crystalline Solids 266: 765-768.
  • Libassi A, Ferrari AC, Stolojan V, Tanner BK, Robertson J & Brown LM (2000). Density, Sp(3) Content And Internal Layering Of Dlc Films By X-ray Reflectivity And Electron Energy Loss Spectroscopy. Diamond And Related Materials 9: 771-776.
  • Su Y, Du CH, Tanner BK, Hatton PD, Collins SP, Brown S, Paul DF & Cheong SW (2000). X-ray Scattering Studies Of Charge Stripes In Manganites And Nickelates. Stripes And Related Phenomena 473-480.
  • Tanner, B.K. (1999). Guest Editor's introduction. Journal of Physics D Applied Physics 32: A1-A2.
  • Mock P, Fukuzawa M, Laczik Z, Smith GW, Booker GR, Yamada M, Herms M & Tanner BK (1999). Dislocation Bundles In Gaas Substrates: Assessed By X-ray And Makyoh Topography, X-ray Diffraction, Tem, Scanning Infrared Polariscopy, Light Interferometry, And Nomarski Microscopy. Microscopy Of Semiconducting Materials 1999, Proceedings 67-72.
  • Marrows, C. H., Wiser, Nathan, Hickey, B. J., Hase, T. P. & A. and Tanner, B. K. (1999). Giant magnetoresistance and oscillatory exchange coupling in disordered Co/Cu multilayers. Journal of the Physics of Condensed Matter 11: 81-88.
  • Moeck P, Mizuno K, Tanner BK, Lacey G, Whitehouse CR, Smith GW & Keir AM (1999). Strain Relaxation In Ingaas Epilayers On Gaas By Means Of Twin Formation. Japanese Journal Of Applied Physics Part 1-regular Papers Short Notes & Review Papers 38: 3628-3631.
  • Bowen, D.K. & Tanner, B.K. (1999). Preface to X-ray topography and cystal characterization. A Theme issue published by The Royal Society. "Philosophical Transactions A: Mathematical, Physical and Engineering Sciences" 357: 2629-.
  • Clarke, J., Pape, I., Tanner, B. K. and Wormington, M. (1999). Influence of step-bunching on grazing incidence diffuse x-ray scattering. Journal of the Physics of Condensed Matter 11: 2661-2668.
  • Clarke, J., Marrows, C. H., Stanley, F. E., Bunyan, R. J. & T., Tanner, B. K. and Hickey, B. J. (1999). The effect of conformal roughness on spin-valves. Journal of Physics D Applied Physics 32: 1169-1174.
  • Pape I, Tanner BK & Wormington M (1999). Grazing Incidence X-ray Scattering Measurement Of Silicate Glass Surfaces. Journal Of Non-crystalline Solids 248: 75-83.
  • Tanner, B. K., Keir, A. M., Möck, P., Whitehouse, C. R., & Lacey, G., Johnson, A. D., Smith, G. W. and Clark, G. F. (1999). X-ray optics of in situ synchrotron topography of InGaAs on GaAs. Journal of Physics D Applied Physics 32: A119-A122.
  • Moore, C.D. & Tanner, B.K. (1999). High-resolution X-ray diffraction determination of composition grading in Hg1-xMnxTe grown by interdiffused multilayer organometallic vapour-phase epitaxy. "Philosophical Transactions A: Mathematical, Physical and Engineering Sciences" 357: 2801-.
  • Moore CD & Tanner BK (1999). X-ray Characterisation Of Indium Phosphide Substrates. Materials Science And Engineering B-solid State Materials For Advanced Technology 66: 11-14.
  • Bottani, C. E., Li Bassi, A., Tanner, B. K., Stella, A., & Tognini, P., Cheyssac, P. and Kofman, R. (1999). Melting in metallic Sn nanoparticles studied by surface Brillouin scattering and synchrotron-x-ray diffraction. Physical Review B 59: 15601-.
  • Stolojan V, Brown LM, Ferrari AC, Robertson J, Bassi AL & Tanner BK (1999). Comparative Study Of Properties Of Dlc Films By Electron Energy Loss Spectroscopy And X-ray Reflectivity. Institute of Physics Conference Series 161: 361-364.
  • Fulthorpe, B. D., Joyce, D. E., Hase, T. P. A., Rozatian, & A. S. H., Tanner, B. K. and Grundy, P. J. (1999). The progression of interface structure through sputtered Co/Cu and Co/Pt multilayer films. Journal of the Physics of Condensed Matter 11: 8477-8487.
  • Mizuno K, Mock P, Tanner BK, Lacey G, Whitehouse CR, Smith GW & Keir AM (1999). Partial Strain Relaxation In (in,ga)as Epilayers On Gaas By Means Of Twin Formation. Journal Of Crystal Growth 199: 1146-1150.
  • Aitken NM, Potter MDG, Buckley DJ, Mullins JT, Carles J, Halliday DP, Durose K, Tanner BK & Brinkman AW (1999). Characterisation Of Cadmium Telluride Bulk Crystals Grown By A Novel "multi-tube" Vapour Growth Technique. Journal Of Crystal Growth 199: 984-987.
  • Li, C. R., Tanner, B. K., Ashenford, D. E., Hogg, J. H. & C. and Lunn, B. (1998). The effect of an interfacial layer on the relaxation of CdMnTe/CdTe multiple quantum well structures on InSb substrates. Semiconductor Science and Technology 13: 746-749.
  • Makar, J.M. & Tanner, B.K. (1998). The in situ measurement of the effect of plastic deformation on the magnetic properties of steel Part II - Permeability curves. Journal of Magnetism and Magnetic Materials 187: 353-365.
  • Duffar T, Serrano MD, Moore CD, Camassel J, Contreras S, Dusserre P, Rivoallant A & Tanner BK (1998). Bridgman Solidification Of Gasb In Space. Journal Of Crystal Growth 192: 63-72.
  • Lacey G, Whitehouse CR, Parbrook PJ, Cullis AG, Keir AM, Mock P, Johnson AD, Smith GW, Clark GF, Tanner BK, Martin T, Lunn B, Hogg JHC, Emeny MT, Murphy B & Bennett S (1998). In-situ Direct Measurement Of Activation Energies For The Generation Of Misfit Dislocations In The Ingaas/gaas (001) System. Applied Surface Science 123: 718-724.
  • Pape, I., Hase, T. P. A., Tanner, B. K. and Wormington, & M. (1998). Analysis of grazing incidence X-ray diffuse scatter from Co-Cu multilayers. Physica B Condensed Matter 253: 278-289.
  • Tanner, B. K., Hase, T. P. A., Pape, I., Laidler, H., & Ryan, P. and Hickey, B. J. (1998). The relation of structure to giant magnetoresistance in Co/Cu multilayers. Journal of Magnetism and Magnetic Materials 177: 1164-1165.
  • Tedeschi C, Fontana MP, Pieroni O, Dei L, Wilde J, Pearson C, Petty MC & Tanner BK (1998). Deposition And Characterisation Of Langmuir-blodgett Films Of An Azo-modified Polypeptide Azobenzene-containing Poly-l-lysine. Thin Solid Films 335: 197-202.
  • Tanner BK, Keir AM, Mock P, Whitehouse CR, Lacey G, Johnson AD, Smith GW & Clark GF (1998). X-ray Optics Of In-situ Synchrotron Topography Studies Of The Early Stages Of Relaxation In Epitaxial Ingaas On Gaas. Crystal And Multilayer Optics 3448: 100-107.
  • Makar JM & Tanner BK (1998). The Effect Of Stresses Approaching And Exceeding The Yield Point On The Magnetic Properties Of High Strength Pearlitic Steels. Ndt & E International 31: 117-127.
  • Beghi MG, Bottani CE, Guzman L, Lafford T, Laidani N, Ossi PM & Tanner BK (1998). Structure And Elastic Properties Of Thin Alloyed Gold Films. Thin Solid Films 317: 198-201.
  • Joyce, D. E., Faunce, C. A., Grundy, P. J., Fulthorpe, B. & D., Hase, T. P. A., Pape, I. and Tanner, B. K. (1998). Crystallographic texture and interface structure in Co/Cu multilayer films. Physical Review B 58: 5594-5601.
  • Casalini, R., Goldenberg, L. M., Pearson, C., Tanner, B. & K. and Petty, M. C. (1998). The electrical behaviour of multilayer polypyrrole films. Journal of Physics D Applied Physics 31: 1504-1510.
  • Beghi MG, Bottani CE, Ossi PM, Pastorelli R, Poli M, Tanner BK & Liu BX (1998). Analysis Of Surface And Interface Modifications Of Thin Multilayered Films. Surface & Coatings Technology 101: 324-328.
  • Tanner BK, Mock P & Mizuno K (1998). Identification Of Misfit Dislocations Using X-ray Scattering And Topography. Defect Recognition And Image Processing In Semiconductors 1997 160: 177-186.
  • Makar, J.M. & Tanner, B.K. (1998). The in situ measurement of the effect of plastic deformation on the magnetic properties of steel Part I - Hysteresis loops and magnetostriction. Journal of Magnetism and Magnetic Materials 184: 193-208.
  • Beghi, M. G., Bottani, C. E., Ossi, P. M., Lafford, T. A., & and Tanner, B. K. (1997). Combined surface Brillouin scattering and x-ray reflectivity characterization of thin metallic films. Journal of Applied Physics 81: 672-678.
  • Li, C. R., Tanner, B. K., Möck, P., Hogg, J. H. C., Lunn, & B. and Ashenford, D. E. (1997). High-resolution X-ray scattering from CdMnTe/CdTe multiple quantum well structures. Nuovo Cimento D Serie 19: 447-.
  • Banister AJ, Gorrell IB, Howard JAK, Lawrence SE, Lehman CW, May I, Rawson JM, Tanner BK, Gregory CI, Blake AJ & Fricker SP (1997). Synthesis And Characterisation Of Three Group 10 Metal Dithiadiazolyl Complexes. Journal Of The Chemical Society-dalton Transactions 377-384.
  • Banister AJ, Batsanov AS, Dawe OG, Herbertson PL, Howard JAK, Lynn S, May I, Smith JNB, Rawson JM, Rogers TE, Tanner BK, Antorrena G & Palacio F (1997). Modification Of Molecular Packing: Crystal Structures And Magnetic Properties Of Monomeric And Dimeric Difluorophenyl-1,2,3,5-dithiadiazolyl Radicals. Journal Of The Chemical Society-dalton Transactions 2539-2541.
  • Li, C. R., Tanner, B. K., Ashenford, D. E., Hogg, J. H. & C. and Lunn, B. (1997). High resolution x-ray diffraction and scattering measurement of the interfacial structure of ZnTe/GaSb epilayers. Journal of Applied Physics 82: 2281-2287.
  • Mock P, Tanner BK, Lacey G, Whitehouse CR & Smith GW (1997). Critical Thickness Of Quantum-well Structures: Modified Matthews-blakeslee Formula And Experimental Support Gathered By Means Of Synchrotron X-ray Reflection Topography. Microscopy Of Semiconducting Materials 1997 165-168.
  • Moore, C. D., Pape, I. and Tanner, B. K. (1997). Triple-axis X-ray diffraction study of polishing damage in III-V semiconductors. Nuovo Cimento D Serie 19: 205-.
  • Sang WB, Durose K, Brinkman AW & Tanner BK (1997). Growth And Characterization Of Magnetic Metal Mn Film By Mocvd. Materials Chemistry And Physics 47: 75-77.
  • Bryce MR, Moore AJ, Batsanov AS, Howard JAK, Goldenberg LM, Pearson C, Petty MC & Tanner BK (1997). Structural And Electrical Studies On Nickel(dmit)(2) Complexes. Synthetic Metals 86: 1839-1840.
  • Bryce MR, Moore AJ, Tanner BK, Whitehead R, Clegg W, Gerson F, Lamprecht A & Pfenninger S (1996). Vinylogous Tetrathiafulvalene (ttf) Pi-electron Donors And Derived Radical Cations: Esr Spectroscopic, Magnetic, And X-ray Structural Studies. Chemistry Of Materials 8: 1182-1188.
  • Hickey, B. J., Laidler, H., Hase, T. P. A., Tanner, B. K., & Schad, R. and Bruynseraede, Y. (1996). Effect of annealing on the roughness and GMR of Fe/Cr multilayers. Journal of Magnetism and Magnetic Materials 156: 332-334.
  • Möck, P., Tanner, B. K., Li, C. R., Keir, A. M., Johnson, & A. D., Lacey, G., Clark, G. F., Lunn, B. and Hogg, J. C. H. (1996). ERRATUM: Determination of the critical thickness of misfit dislocation multiplication using in situ double-crystal x-ray diffraction. Semiconductor Science and Technology 11: 1363-.
  • Holland AJ & Tanner BK (1996). Simulation Of Decorated Dislocation Images In X-ray Section Topographs. Philosophical Magazine A-physics Of Condensed Matter Structure Defects And Mechanical Properties 73: 1451-1474.
  • Möck, P., Tanner, B. K., Li, C. R., Keir, A. M., Johnson, & A. D., Lacey, G., Clark, G. F., Lunn, B. and Hogg, J. C. H. (1996). Determination of the critical thickness of misfit dislocation multiplication using in situ double-crystal x-ray diffraction. Semiconductor Science and Technology 11: 1051-1055.
  • Loxley N, Gray T, Tanner BK & Bowen DK (1996). Principles And Performance Of A Multi-axis, Direct Drive X-ray Diffractometer For The Characterisation Of Advanced Materials. Surfaces, Vacuum, And Their Applications 672-677.
  • Banister AJ, Bricklebank N, Lavender I, Rawson JM, Gregory CI, Tanner BK, Clegg W, Elsegood MRJ & Palacio F (1996). Spontaneous Magnetization In A Sulfur-nitrogen Radical At 36 K. Angewandte Chemie International Edition 35: 2533-2535.
  • Tanner, B. K., Pape, I., Hase, T. P. A., Laidler, H., & Emmerson, C., Hickey, B. J. and Shen, T. (1996). Giant magnetoresistance and interface structure of Cu/Co multilayers grown by MBE on Si (111) substrates with copper-silicide buffers. Journal of Magnetism and Magnetic Materials 156: 373-374.
  • Wormington M, Pape I, Hase TPA, Tanner BK & Bowen DK (1996). Evidence For Grading At Polished Surfaces From Grazing-incidence X-ray Scattering. Philosophical Magazine Letters 74: 211-216.
  • Tanner BK (1996). X-ray Scattering For Semiconductor Characterisation. Semiconductor Characterization - Present Status And Future Needs 263-272.
  • Hickey, B. J., Laidler, H., Pape, I., Gregory, C. I. and & Tanner, B. K. (1996). X-ray and magnetoresistance measurements of annealed Co/Cu multilayers. Journal of Magnetism and Magnetic Materials 154: 165-174.
  • Port, R.I., Moore, C.D., Tanner, B.K., Durose, K. & Hails, J.E. (1995). Depth Resolved X-ray Studies Of Tilt Distributions In Cdte/gaas Epilayers. Microscopy Of Semiconducting Materials 146: 309-312.
  • Tobin SP, Tower JP, Norton PW, Chandlerhorowitz D, Amirtharaj PM, Lopes VC, Duncan WM, Syllaios AJ, Ard CK, Giles NC, Lee J, Balasubramanian R, Bollong AB, Steiner TW, Thewalt MLW, Bowen DK & Tanner BK (1995). A Comparison Of Techniques For Nondestructive Composition Measurements In Cdznte Substrates. Journal Of Electronic Materials 24: 697-705.
  • Tanner, B.K. & Safa, M. (1995). The effect of capping layers on low-angle Bragg peaks from copper-cobalt multilayers. Journal of Magnetism and Magnetic Materials 150: L290-L292.
  • Cockerton, S., Tanner, B.K. & Derbyshire, G. (1995). A novel high dynamic range X-ray detector for synchrotron radiation studies. Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and 97: 561-566.
  • Holland, A.J. & Tanner, B.K. (1995). Simulation of X-ray section topograph images of oxygen precipitates in silicon. Journal of Physics D Applied Physics 28: A27-A32.
  • Banister AJ, Bricklebank N, Clegg W, Elsegood MRJ, Gregory CI, Lavender I, Rawson JM & Tanner BK (1995). The First Solid-state Paramagnetic 1,2,3,5-dithiadiazolyl Radical - X-ray Crystal-structure Of [p-ncc6f4cnssn]center-dot. Journal Of The Chemical Society-chemical Communications 679-680.
  • Bowen DK & Tanner BK (1995). A Method For The Accurate Comparison Of Lattice Parameters. Journal Of Applied Crystallography 28: 753-760.
  • Barnett, S. J., Keir, A. M., Cullis, A. G., Johnson, A. D., Jefferson, J., Smith, G. W., Martin, T., Whitehouse, C. R., Lacey, G., Clark, G. F., Tanner, B. K., Spirkl, W., Lunn, B., Hogg, J. C. H., Ashu, & P., Hagston, W. E. and Castelli, C. M. (1995). In situ X-ray topography studies during the molecular beam epitaxy growth of InGaAs on (001) GaAs: effects of substrate dislocation distribution on strain relaxation. Journal of Physics D Applied Physics 28: A17-A22.
  • Whitehouse CR, Cullis AG, Barnett SJ, Usher BF, Clark GF, Keir AM, Tanner BK, Lunn B, Hogg JCH, Johnson AD, Lacey G, Spirkl W, Hagston WE, Jefferson JH, Ashu P & Smith GW (1995). In-situ X-ray-imaging Of Iii-v Strained-layer Relaxation Processes. Journal Of Crystal Growth 150: 85-91.
  • Hallam TD, Oktik S, Funaki M, Moore C, Brinkman AW, Durose K & Tanner BK (1995). Uniformity In (hg, Mn)te Films Grown By Metalorganic Vapor-phase Epitaxy. Journal Of Crystal Growth 146: 604-609.
  • Loxley N, Tanner BK & Bowen DK (1995). A Novel Beam-conditioning Monochromator For High-resolution X-ray-diffraction. Journal Of Applied Crystallography 28: 314-317.
  • Bowen DK & Tanner BK (1994). New Methods For The Accurate Comparison Of Lattice-parameters. Advances In X-ray Analysis 37: 123-128.
  • Spirkl W, Tanner BK, Whitehouse C, Barnett SJ, Cullis AG, Johnson AD, Keir A, Usher B, Clark GE, Hagston W, Hogg CR & Lunn B (1994). Simulation Of X-ray Reflection Topographs From Misfit Dislocations. Philosophical Magazine A-physics Of Condensed Matter Structure Defects And Mechanical Properties 69: 221-236.
  • Loxley N, Cockerton S & Tanner BK (1994). High-speed Characterization Of Pseudomorphic Hemt Structures Using A Very-low Noise Scintillation Detector. Advances In X-ray Analysis 37: 145-151.
  • Tanner BK (1994). Application Of Synchrotron X-ray Topography To The Study Of Materials. Acta Physica Polonica A 86: 537-544.
  • Thompson, S.M. & Tanner, B.K. (1994). The magnetic properties of specially prepared pearlitic steels of varying carbon content as a function of plastic deformation. Journal of Magnetism and Magnetic Materials 132: 71-88.
  • Hudson JM, Tanner BK & Blunt R (1994). Fourier Transformation Of X-ray Rocking Curves From Interferometer Structures. Advances In X-ray Analysis 37: 135-144.
  • Bowen DK, Tanner BK, Hudson JM, Pape I, Loxley N & Tobin S (1994). Experimental Comparison Of Widely Differing Lattice-parameters. Advances In X-ray Analysis 37: 129-133.
  • Spirkl W, Tanner BK, Whitehouse C, Barnett SJ, Cullis AG, Johnson AD, Keir A, Usher B, Clark GF, Hagston W, Hogg CR & Lunn B (1994). Dislocation Contrast In X-ray Reflection Topography Of Strained Heterostructures. Philosophical Magazine A-physics Of Condensed Matter Structure Defects And Mechanical Properties 70: 531-548.
  • Westwood, S. M., Lewis, V. G., O'Grady, K. and Tanner, B. & K. (1993). Measurement of inter-particle interactions in a single magnetic ink aggregate. Journal of Magnetism and Magnetic Materials 125: L247-L250.
  • Barnett, S. J., Whitehouse, C. R., Keir, A. M., Clark, G. & F., Usher, B., Tanner, B. K., Emeny, M. T. and Johnson, A. D. (1993). X-ray topography of lattice relaxation in strained layer semiconductors: post-growth studies and a new facility for in situ topography during MBE growth. Journal of Physics D Applied Physics 26: A45-A49.
  • Thompson, S.M. & Tanner, B.K. (1993). The magnetic properties of pearlitic steels as a function of carbon content. Journal of Magnetism and Magnetic Materials 123: 283-298.
  • Tanner BK, Hallam TD, Funaki M & Brinkman AW (1993). High-resolution X-ray-diffraction Of Hg1-xmnxte Epitaxial-films. Evolution Of Surface And Thin Film Microstructure 280: 635-640.
  • Funaki, M., Brinkman, A. W., Hallam, T. D. and Tanner, B. & K. (1993). Epitaxial growth of (Hg,Mn)Te by the interdiffused multilayer process. Applied Physics Letters 62: 2983-2985.
  • Tanner BK & Bowen DK (1993). Advanced X-ray-scattering Techniques For The Characterization Of Semiconducting Materials. Journal Of Crystal Growth 126: 1-18.
  • Batsanov AS, Bryce MR, Davies SR, Howard JAK, Whitehead R & Tanner BK (1993). Studies On Pi-acceptor Molecules Containing The Dicyanomethylene Group - X-ray Crystal-structure Of The Charge-transfer Complex Of Tetramethyltetrathiafulvalene And 2,3-dicyano-1,4-naphthoquinone - (tmttf)3-(dcnq)2. Journal Of The Chemical Society-perkin Transactions 2 313-319.
  • Funaki, M., Lewis, J. E., Hallam, T. D., Li, Chaorong, & Halder, S. K., Brinkman, A. W. and Tanner, B. K. (1993). The MOVPE growth and characterization of Hg1-xMnxTe. Semiconductor Science and Technology 8: 200-.
  • Bowen, D.K. & Tanner, B.K. (1993). Characterization of engineering surfaces by grazing-incidence X-ray reflectivity. Nanotechnology 4: 175-182.
  • Banister AJ, Lavender I, Rawson JM, Clegg W, Tanner BK & Whitehead RJ (1993). Preparation And Characterization Of The Mixed 1,3,2,4-dithiadiazolylium/1,2,3,5-dithiadiazolylium Salts And Related Free-radicals - [m-snsnc-c6h4-cnssn]x And [p-snsnc-c6h4-cnssn]x (x = 2+,+ Or 2.). Journal Of The Chemical Society-dalton Transactions 1421-1429.
  • Whitehouse CR, Barnett SJ, Usher BF, Cullis AG, Keir AM, Johnson AD, Clark GF, Tanner BK, Spirkl W, Lunn B, Hagston WE & Hogg JCH (1993). In-situ Synchrotron X-ray Studies Of Epitaxial Strained-layer Growth-processes. Microscopy Of Semiconducting Materials 1993 563-568.
  • Cottrell, S., Spirkl, W. and Tanner, B. K. (1993). Simulation of dislocation images in Bragg-case double-crystal topographs of misfit dislocations in relaxed epitaxial layers of III-V semiconductors. Journal of Physics D Applied Physics 26: A126-A130.
  • Hallam, T. D., Halder, S. K., Hudson, J. M., Li, C. R., & Funaki, M., Lewis, J. E., Brinkman, A. W. and Tanner, B. K. (1993). X-ray scattering and topography studies of Hg1-xMnxTe epitaxial films. Journal of Physics D Applied Physics 26: A161-A166.
  • Hallam, T. D., Halder, S. K., Hudson, J. M., Li, C. R., & Funaki, M., Lewis, J. E., Brinkman, A. W. and Tanner, B. K. (1993). X-ray scattering and topography studies of Hg_1-xMn_xTe epitaxial films. Journal of Physics D Applied Physics 26: 161-.
  • Holland, A.J. & Tanner, B.K. (1993). Contrast of device structures in X-ray section topographs. Journal of Physics D Applied Physics 26: A137-A141.
  • Halfpenny, P. J., Green, G. S. and Tanner, B. K. (1993). X-ray topography studies of the defect depth profile in processed silicon wafers. Journal of Physics D Applied Physics 26: A65-A68.
  • Tanner, B.K. (1993). X-ray scattering from multiple-layer structures forming Bragg-case interferometers. Journal of Physics D Applied Physics 26: A151-A155.
  • Bissell, P. R., Chantrell, R. W., Hoon, S. R., Lambrick, & D. B. and Tanner, B. K. (1992). Small-angle X-ray scattering study of ferrofluids. Journal of Magnetism and Magnetic Materials 104: 1551-1552.
  • Tanner BK, Bowen DK, Petty MC, Swaminathan S & Grunfeld F (1992). Grazing-incidence X-ray Reflectometry Studies Of Cadmium Arachidate Langmuir-blodgett-films. Interface Dynamics And Growth 237: 281-286.
  • Tanner BK & Hudson JM (1992). Characterization Of Magnetic Multilayers By Grazing-incidence X-ray Reflectivity. Ieee Transactions On Magnetics 28: 2736-2741.
  • Wormington M, Bowen DK & Tanner BK (1992). Principles And Performance Of A Pc-based Program For Simulation Of Grazing-incidence X-ray Reflectivity Profiles. Structure And Properties Of Interfaces In Materials 238: 119-124.
  • Tanner, B. K., Baruchel, J. and Abell, J. S. (1992). Internal magnetic domain structure changes in thick TbAl2 crystals revealed by polarized neutron topography. Journal of Magnetism and Magnetic Materials 104: 317-318.
  • Sandonís, J., Baruchel, J., Tanner, B. K., Fillion, G., & Kvardakov, V. V. and Podurets, K. M. (1992). Coupling between antiferro and ferromagnetic domains in hematite. Journal of Magnetism and Magnetic Materials 104: 350-352.
  • Hudson JM, Powell AR, Bowen DK, Wormington M, Tanner BK, Kubiak RA & Parker EHC (1992). Thermal-degradation Of Sige Interfaces Studied By X-ray Reflectivity And Diffraction. Thin Films Stress And Mechanical Properties Iii 239: 455-460.
  • Tanner, B. K., Pilkington, C. S. and Wanklyn, B. M. (1992). Time-dependent magnetization in the 1D spin glass Fe2TiO5. Journal of Magnetism and Magnetic Materials 104: 1611-1612.
  • Tanner BK & Bowen DK (1992). Synchrotron X-radiation Topography. Materials Science Reports 8: 369-407.
  • Whitehouse, C. R., Barnett, S. J., Soley, D. E. J., Quarrell, J., Aldridge, S. J., Cullis, A. G., Emeny, M. T., Johnson, A. D., Clarke, G. F., Lamb, W., Tanner, B. K., Cottrell, S., Lunn, B., Hogg, C., & and Hagston, W. (1992). An MBE growth facility for real-time in situ synchrotron x-ray topography studies of strained-layer III-V epitaxial materials. Review of Scientific Instruments 63: 634-637.
  • Dai DY, Green GS, Tanner BK, Li HC, Yi HR & Wang RL (1991). High-resolution Double Crystal Diffractometry Of High-tc Superconducting Epitaxial Gd-ba-cu-o Films. Defects In Materials 209: 841-846.
  • Green GS, Loxley N & Tanner BK (1991). Dislocation Images In X-ray Section Topographs Of Curved Crystals. Journal Of Applied Crystallography 24: 304-311.
  • Green GS, Tanner BK, Turnbull AG, Barnett SJ, Emeny M & Whitehouse CR (1991). Misfit Dislocations At The Critical Thickness For Ingaas/gaas Strained Layers. Evolution Of Thin-film And Surface Microstructure 202: 507-512.
  • Tanner, B. K., Turnbull, A. G., Stanley, C. R., Kean, A. & H. and McElhinney, M. (1991). Measurement of aluminum concentration in epitaxial layers of AlxGa1 - xAs on GaAs by double axis x-ray diffractometry. Applied Physics Letters 59: 2272-2274.
  • Green GS, Tanner BK & Kightley P (1991). Double Axis X-ray-diffractometry Analysis Of The Homoepitaxial Interface Between Substrate And Buffer Layer. Advances In Surface And Thin Film Diffraction 208: 315-320.
  • Bowen DK, Loxley N, Tanner BK, Cooke L & Capano MA (1991). Principles And Performance Of A Pc-based Program For Simulation Of Double-axis X-ray Rocking Curves Of Thin Epitaxial-films. Advances In Surface And Thin Film Diffraction 208: 113-118.
  • Dai, D. Y., Green, G. S., Tanner, B. K., Cui, S. F., Mai, & Z. H., Li, H. C., Yi, H. R. and Wang, R. L. (1991). Structural analysis of high-Tc epitaxial GdBa2Cu3O7-x superconducting thin films. Superconductor Science Technology 4: 348-352.
  • Holland AJ, Green GS, Tanner BK & Mai ZH (1991). X-ray Topography Studies Of Oxygen Precipitates In Mcz Silicon. Defects In Materials 209: 475-480.
  • Turnbull AG, Green GS, Tanner BK & Halliwell MAG (1991). Asymmetric Relaxation In Epitaxial Layers Of Iii-v Compounds. Evolution Of Thin-film And Surface Microstructure 202: 513-518.
  • Tanner BK, Miles SJ, Bowen DK, Hart L & Loxley N (1991). X-ray Reflectometry From Semiconductor Surfaces And Interfaces. Advances In Surface And Thin Film Diffraction 208: 345-350.
  • Loxley N, Bowen DK & Tanner BK (1991). The Performance Of Channel Cut Collimators For Precision X-ray-diffraction Studies Of Epitaxial Layers. Advances In Surface And Thin Film Diffraction 208: 107-112.
  • Green GS, Tanner BK, Barnett SJ, Emeny M, Pitt AD, Whitehouse CR & Clark GF (1990). Nucleation Of Misfit Dislocations In Strained-layer Ingaas On Gaas. Philosophical Magazine Letters 62: 131-137.
  • Thompson, S.M. & Tanner, B.K. (1990). The magnetic properties of plastically deformed steels. Journal of Magnetism and Magnetic Materials 83: 221-222.
  • Tanner BK (1990). High-resolution X-ray-diffraction And Topography For Crystal Characterization. Journal Of Crystal Growth 99: 1315-1323.
  • Alourfi MS & Tanner BK (1990). Theoretical Modeling And Czochralski Growth Of High Perfection Nickel Single-crystals. Journal Of Crystal Growth 99: 139-144.
  • McCoy, J.M. & Tanner, B.K. (1990). Computer simulations of indications in magnetic particle inspection. Journal of Physics D Applied Physics 23: 593-599.
  • Thompson SM, Allen PJ & Tanner BK (1990). Magnetic-properties Of Welds In High-strength Pearlitic Steels. Ieee Transactions On Magnetics 26: 1984-1986.
  • Cockerton S, Miles SJ, Green GS & Tanner BK (1990). Effect Of Interface Structure On The X-ray Double Crystal Rocking Curve Peak Position From Very Thin-layers In The Highly Asymmetric Bragg Geometry. Journal Of Crystal Growth 99: 1324-1328.
  • Loxley, N., Bowen, D.K. & Tanner, B.K. (1990). Application of a Desk-Side Double-Axis X-Ray Diffractometer for Very Large Area Epilayer Characterization. MRS Proceedings 208: 119-124.
  • Tanner BK (1989). X-ray Topography And Precision Diffractometry Of Semiconducting Materials. Journal Of The Electrochemical Society 136: 3438-3443.
  • McCoy, J.M. & Tanner, B.K. (1989). Magnetisation of inks for magnetic particle inspection. Journal of Physics D Applied Physics 22: 1366-1371.
  • Birkett, A. J., Corner, W. D., Tanner, B. K. and & Thompson, S. M. (1989). LETTER TO THE EDITOR: Influence of plastic deformation on Barkhausen power spectra in steels. Journal of Physics D Applied Physics 22: 1240-1242.
  • Miles SJ, Green GS, Tanner BK, Halliwell MAG & Lyons MH (1989). Assessment Of Thin Heteroepitaxial Layers Using Skew Angle Asymmetrical X-ray Double Crystal Diffraction. Characterization Of The Structure And Chemistry Of Defects In Materials 138: 539-544.
  • Yang P, Green GS & Tanner BK (1989). Dislocation Contrast In X-ray Section And Projection Topographs Of Elastically Deformed-crystals. Institute Of Physics Conference Series 467-471.
  • Cockerton S, Green GS & Tanner BK (1989). Double Crystal Synchrotron X-ray-diffraction Study Of Stoichiometry In Gallium-arsenide. Characterization Of The Structure And Chemistry Of Defects In Materials 138: 65-70.
  • Cui SF, Green GS & Tanner BK (1989). X-ray Section Topography Of Hydrogen Precipitates In Silicon. Characterization Of The Structure And Chemistry Of Defects In Materials 138: 71-76.
  • Tanner BK, Miles SJ, Peterson GG & Sacks RN (1988). Measurement Of Aluminum Concentration In Gaalas Epitaxial Layers By Double-axis X-ray-diffraction. Materials Letters 7: 239-241.
  • Eaglesham, D. J., Kvam, E. P., Maher, D. M., Humphreys, C. & J., Green, G. S., Tanner, B. K. and Bean, J. C. (1988). X-ray topography of the coherency breakdown in GexSi1 - x/Si(100). Applied Physics Letters 53: 2083-2085.
  • Willcock, S. N. M., Tanner, B. K. and Mundell, P. (1988). The parameterization of virgin B-H curves of high strength steels. Journal of Magnetism and Magnetic Materials 72: 45-51.
  • Tanner, B.K. & Halliwell, M.A.G. (1988). Interference structures in double-crystal X-ray rocking curves from very thin multiple epitaxial layers. Semiconductor Science and Technology 3: 967-972.
  • Jiang SS, Surowiec M & Tanner BK (1988). Ferroelastic Domain-structures And Phase-transitions In Barium Sodium Niobate. Journal Of Applied Crystallography 21: 145-150.
  • Tanner BK, Clark GF & Safa M (1988). Domain-structures In Hematite (alpha-fe2o3). Philosophical Magazine B-physics Of Condensed Matter Statistical Mechanics Electronic Optical And Magnetic Properties 57: 361-377.
  • Tanner BK, Szpunar JA, Willcock SNM, Morgan LL & Mundell PA (1988). Magnetic And Metallurgical Properties Of High-tensile Steels. Journal Of Materials Science 23: 4534-4540.
  • Lucas, C. A., Hatton, P. D., Bates, S., Ryan, T. W., & Miles, S. and Tanner, B. K. (1988). Characterization of nanometer-scale epitaxial structures by grazing-incidence x-ray diffraction and specular reflectivity. Journal of Applied Physics 63: 1936-1941.
  • McCoy JM & Tanner BK (1988). Simulation Of Particle Trajectories In Magnetic Particle Inspection. Ieee Transactions On Magnetics 24: 1665-1667.
  • Surowiec MR & Tanner BK (1987). X-ray Topographic Study Of Dislocations Around Indents On (111) Surfaces Of Indium-antimonide. Journal Of Applied Crystallography 20: 499-504.
  • Jiang SS, Lang AR & Tanner BK (1987). The Contrast Of Stacking-faults In Optical Birefringence Micrographs Of Diamond. Philosophical Magazine A-physics Of Condensed Matter Structure Defects And Mechanical Properties 56: 367-375.
  • Chu X & Tanner BK (1987). Bragg Case X-ray Moire Patterns Observed In Gaalas/gaas Laser Structures. Materials Letters 5: 153-155.
  • Tanner BK & Cringean JK (1987). Real-time And Stroboscopic Topography. Progress In Crystal Growth And Characterization Of Materials 14: 403-424.
  • Chu, X. & Tanner, B.K. (1987). Double crystal x-ray rocking curves of multiple layer structures. Semiconductor Science and Technology 2: 765-771.
  • Green GS & Tanner BK (1987). Computer-simulation Of X-ray Topographs Of Curved Silicon-crystals. Institute Of Physics Conference Series 627-632.
  • Baruchel, J., Clark, G., Tanner, B. K. and Watts, B. E. (1987). Neutron topographic investigation of the Morin transition in flux-grown crystals of α-Fe2O3. Journal of Magnetism and Magnetic Materials 68: 374-378.
  • Barnett SJ, Brown GT & Tanner BK (1987). The Distribution Of Lattice Strain And Tilt In Lec Semi-insulating Gaas Measured By Double Crystal X-ray Topography. Institute Of Physics Conference Series 615-620.
  • Willcock, S. N. M., Tanner, B. K. and Mundell, P. A. (1987). The magnetic properties of seamless steel pipe. Journal of Magnetism and Magnetic Materials 66: 153-157.
  • Hetherington MG, Jakubovics JP, Szpunar JA & Tanner BK (1987). High-voltage Lorentz Electron-microscopy Studies Of Domain-structures And Magnetization Processes In Pearlitic Steels. Philosophical Magazine B-physics Of Condensed Matter Statistical Mechanics Electronic Optical And Magnetic Properties 56: 561-577.
  • Surowiec MR & Tanner BK (1987). X-ray Topographic Investigation Of Microdeformation Of Insb Single-crystals. Philosophical Magazine A-physics Of Condensed Matter Structure Defects And Mechanical Properties 55: 791-805.
  • Tanner, B.K. & Hill, M.J. (1986). LETTER TO THE EDITOR: Double axis X-ray diffractometry at glancing angles. Journal of Physics D Applied Physics 19: L229-L235.
  • Hsu SS & Tanner BK (1986). X-ray Topographic Studies In The Peoples-republic-of-china. Progress In Crystal Growth And Characterization Of Materials 13: 63-75.
  • Tanner BK, McCoy JM, Willcock SNM, Hetherington MG & Jakubovics JP (1986). The Structure And Behavior Of Inks For Magnetic Particle Inspection. Journal Of Materials Science Letters 5: 296-298.
  • Willcock SNM & Tanner BK (1986). The Application Of Harmonic-analysis To The Magnetic-properties Of High-tensile Steels. Materials Letters 4: 307-312.
  • Chu, X. & Tanner, B.K. (1986). Interference peaks in double-crystal x-ray rocking curves of laser structures. Applied Physics Letters 49: 1773-1775.
  • Hoon SR, Shelton A & Tanner BK (1985). Time-dependent Resistivity In Carbon-fiber Sheets. Journal Of Materials Science 20: 3311-3319.
  • Hoon, S.R. & Tanner, B.K. (1985). Magnetic fluids - part 2. Physics Education 20: 120-123.
  • Hoon, S.R. & Tanner, B.K. (1985). Magnetic fluids - part 1. Physics Education 20: 61-65.
  • Clark, G.F., Tanner, B.K. & Abell, J.S. (1985). Low temperature synchrotron X-radiation topography observations of magnetic domains in TbAl2. Journal of Magnetism and Magnetic Materials 49: 317-324.
  • Hill MJ, Tanner BK, Halliwell MAG & Lyons MH (1985). Simulation Of X-ray Double-crystal Rocking Curves Of Multiple And Inhomogeneous Heteroepitaxial Layers. Journal Of Applied Crystallography 18: 446-451.
  • Paige, D.M., Szpunar, B. & Tanner, B.K. (1984). The magnetocrystalline anisotropy of cobalt. Journal of Magnetism and Magnetic Materials 44: 239-248.
  • Paige DM, Hoon SR, Tanner BK & Ogrady K (1984). High-precision Torque Hysteresis Measurements On Fine Particle-systems. Ieee Transactions On Magnetics 20: 1852-1854.
  • Gani SMA, Tanner BK, Mckenney TG, Hingle HT & Bowen DK (1984). An Assessment Of Diamond Turning For The Production Of Silicon X-ray Optical-elements. Journal Of Applied Crystallography 17: 111-117.
  • Kilner M, Hoon SR, Lambrick DB, Potton JA & Tanner BK (1984). Preparation And Properties Of Metallic Iron Ferrofluids. Ieee Transactions On Magnetics 20: 1735-1737.
  • Tanner BK (1984). Contrast Of Heavily Decorated Dislocations In Optical Birefringence Micrographs. Philosophical Magazine A-physics Of Condensed Matter Structure Defects And Mechanical Properties 49: 435-444.
  • Szpunar JA & Tanner BK (1984). Grain Shape And Distribution Of The Grain-boundary Density In Polycrystalline Materials. Journal Of Materials Science 19: 3249-3254.
  • Clark GF, Goddard PA, Nicholson JRS, Tanner BK & Wanklyn BM (1983). Evidence For Very-large-area Magnetic Domain-walls In Hematite (alpha-fe2o3). Philosophical Magazine B-physics Of Condensed Matter Statistical Mechanics Electronic Optical And Magnetic Properties 47: 307-313.
  • Chantrell, R. W., Tanner, B. K. and Hoon, S. R. (1983). Determination of the magnetic anisotropy of ferrofluids from torque magnetometry data. Journal of Magnetism and Magnetic Materials 38: 83-92.
  • Parpia, D.Y., Tanner, B.K. & Lord, D.G. (1983). Direct optical observation of ferromagnetic domains. Nature 303: 684-.
  • Hoon, S.R., Tanner, B.K. & Kilner, M. (1983). Torque magnetometry of magnetic fluids. Journal of Magnetism and Magnetic Materials 39: 30-34.
  • Willcock SNM & Tanner BK (1983). Harmonic-analysis Of B-h Loops Of Constructional Steel. Ieee Transactions On Magnetics 19: 2145-2147.
  • Halliwell MAG, Lyons MH, Tanner BK & Ilczyszyn P (1983). Assessment Of Epitaxial Layers By Automated Scanning Double Axis Diffractometry. Journal Of Crystal Growth 65: 672-678.
  • Hoon, S. R., Kilner, M., Russell, G. J. and Tanner, B. K. (1983). Preparation and properties of nickel ferrofluids. Journal of Magnetism and Magnetic Materials 39: 107-110.
  • Willcock SNM & Tanner BK (1983). Harmonic-analysis Of B-h Loops. Ieee Transactions On Magnetics 19: 2265-2270.
  • Cayless, A. T., Hoon, S. R., Tanner, B. K., Chantrell, R. & W. and Kilner, M. (1983). High sensitivity measurements of néel relaxation in fine particle ferromagnetic systems. Journal of Magnetism and Magnetic Materials 30: 303-311.
  • Whatmore RW, Goodard PA & Tanner BK (1983). Stroboscopic X-ray Topography Of Surface Acoustic-wave Devices. Ieee Transactions On Sonics And Ultrasonics 30: 209-209.
  • Chantrell, R. W., Hoon, S. R. and Tanner, B. K. (1983). Time-dependent magnetization in fine-particle ferromagnetic systems. Journal of Magnetism and Magnetic Materials 38: 133-141.
  • Isenberg, C., Hoon, S. R. and Tanner, B. K. (1982). LETTERS: Standing waves. Physics Education 17: 4-.
  • Paige, D.M. & Tanner, B.K. (1982). A robust inexpensive torque magnetometer with on-line data analysis. Journal of Physics E Scientific Instruments 15: 128-131.
  • Goddard, P. A., Clark, G. F., Corner, W. D., Tanner, B. & K., Abell, J. S., Fort, D. and Jones, D. W. (1982). Assessment of the crystal lattice perfection of rare earth and intermetallic single crystals by x-ray topography. Journal of Magnetism and Magnetic Materials 29: 39-45.
  • Clark GF, Tanner BK & Savage HT (1982). Synchrotron X-radiation Topography Studies Of The Magnetization Process In Tb0.27dy0.73fe2. Philosophical Magazine B-physics Of Condensed Matter Statistical Mechanics Electronic Optical And Magnetic Properties 46: 331-343.
  • Whatmore, R. W., Goddard, P. A., Tanner, B. K. and Clark, & G. F. (1982). Direct imaging of travelling Rayleigh waves by stroboscopic X-ray topography. Nature 299: 44-46.
  • Clark, G. F., Tanner, B. K., Farrant, S. and Jones, D. W. (1982). Measurement of the spontaneous magnetostriction of terbium by x-ray diffractometry. Journal of Magnetism and Magnetic Materials 29: 71-78.
  • Maccormack IB, Corner WD & Tanner BK (1981). Magnetic-properties Of Electrodeposited Iron Foil. Ieee Transactions On Magnetics 17: 2940-2942.
  • Hoon, S.R. & Tanner, B.K. (1981). The physics of music. Physics Education 16: 300-311.
  • Waltham, N.R., Clark, G.F. & Tanner, B.K. (1981). Low temperature thermometry using inexpensive silicon diodes. Physics Education 16: 104-107.
  • Tanner BK (1981). Diffraction Techniques In The Study Of Magnetic Domains And Magnetostriction. Science Progress 67: 411-440.
  • Buckleygolder IM & Tanner BK (1980). Deformation Studies Of Initially Dislocation-free Copper-crystals3. Insitu X-ray Topography. Philosophical Magazine A-physics Of Condensed Matter Structure Defects And Mechanical Properties 42: 559-573.
  • Smith, R.L., Corner, W.D. & Tanner, B.K. (1980). An apparatus for observing magnetic domains at low temperatures and in large applied fields. Journal of Physics E Scientific Instruments 13: 620-622.
  • Jones, F.J. & Tanner, B.K. (1980). A double axis X-ray diffractometer for magnetostriction measurements. Journal of Physics E Scientific Instruments 13: 1183-1188.
  • Clark GF, Tanner BK & Wanklyn BM (1980). X-ray Topographic Assessment Of Flux-grown Crystals Of Rare-earth Germanates (r2ge2o7). Journal Of Materials Science 15: 1328-1330.
  • Smith, R.L., Corner, W.D. & Tanner, B.K. (1980). The magnetic domain structure of gadolinium between 230 and 293 K. Journal of Magnetism and Magnetic Materials 20: 265-270.
  • Money, D. G., Paige, D. M., Corner, W. D. and Tanner, B. & K. (1980). Magnetostriction measurements on the model Heisenberg antiferromagnet KNiF3. Journal of Magnetism and Magnetic Materials 15: 603-604.
  • Tanner, B.K. (1980). Magneto-optical experiments on rare earth garnet films. American Journal of Physics 48: 59-63.
  • Corner, W. D., Bareham, H., Smith, R. L., Saad, F. M., Tanner, B. K., Farrant, S., Jones, D. W., Beaudry, B. J. and Gschneidner, & K. A. (1980). Magnetic domain structures in high purity single crystal terbium. Journal of Magnetism and Magnetic Materials 15: 1488-1490.
  • Chikaura Y & Tanner BK (1979). Evidence Of Interactions Between Domain-walls And A Dislocation Bundle In Synchrotron X-radiation Topographs Of Iron Whisker Crystals. Japanese Journal Of Applied Physics 18: 1389-1390.
  • Clark GF, Tanner BK, Sery RS & Savage HT (1979). Magnetization Process In Rare-earth Iron Laves Phase-compounds. Journal De Physique 40: 183-183.
  • Buckleygolder IM & Tanner BK (1979). Deformation Studies Of Initially Dislocation-free Copper-crystals2. Constant Strain Rate Tests On Cr-plated Crystals. Philosophical Magazine A-physics Of Condensed Matter Structure Defects And Mechanical Properties 39: 551-562.
  • Tanner BK, Macdowall DW, Maccormack IB & Smith RL (1979). Ferromagnetism In Ancient Copper-based Coinage. Nature 280: 46-48.
  • Tanner BK (1979). Anti-ferromagnetic Domains. Contemporary Physics 20: 187-210.
  • Sery, R. S., Savage, H. T., Tanner, B. K. and Clark, G. & F. (1978). Domain configurations in single crystal TbFe2 and Tb0.27Dy0.73Fe2. Journal of Applied Physics 49: 2010-2012.
  • Smith SH, Garton G, Tanner BK & Midgley D (1978). Flux Growth And Characterization By X-ray Topography Of Rare-earth Arsenates. Journal Of Materials Science 13: 620-626.
  • Safa M & Tanner BK (1978). Anti-ferromagnetic Domain-wall Motion In Knif3 And Kcof3 Observed By X-ray Synchrotron Topography. Philosophical Magazine B-physics Of Condensed Matter Statistical Mechanics Electronic Optical And Magnetic Properties 37: 739-750.
  • Tanner, B.K. (1978). Quantitative reflectivity measurements. Physics Education 13: 120-122.
  • Maccormack IB & Tanner BK (1978). Application Of X-ray Synchrotron Topography To Insitu Studies Of Recrystallization. Journal Of Applied Crystallography 11: 40-43.
  • Smith, S.R.P. & Tanner, B.K. (1978). γ-ray diffractometry of lattice distortions in TbVO4 caused by the Jahn-Teller phase transition. Journal of Physics C Solid State Physics 11: L717-L720.
  • Safa M & Tanner BK (1977). Behavior Of Antiferromagnetic Domains In Knif3. Physica B & C 86: 1347-1348.
  • Tanner BK, Safa M & Midgley D (1977). Cryogenic X-ray Topography Using Synchrotron Radiation. Journal Of Applied Crystallography 10: 91-99.
  • Safa M, Tanner BK, Garrard BJ & Wanklyn BM (1977). Perfection Studies Of Kmf3 (m=fe,co,ni) Crystals Grown From Flux. Journal Of Crystal Growth 39: 243-249.
  • Smith, R.L., Tanner, B.K. & Corner, W.D. (1977). The effect of nonmagnetic inclusions on the easy direction of gadolinium. Journal of Physics F Metal Physics 7: L229-L232.
  • Warren, J.W. & Tanner, B.K. (1977). LETTERS: Narrow-band model. Physics Education 12: 211-212.
  • Safa M, Tanner BK, Klapper H & Wanklyn BM (1977). Direction Of Dislocations In Flux-grown Crystals. Philosophical Magazine 35: 811-816.
  • Buckleygolder IM, Tanner BK & Clark GF (1977). Simple Automatic Cassette For X-ray Synchrotron Topography. Journal Of Applied Crystallography 10: 502-502.
  • Tanner BK, Midgley D & Safa M (1977). Dislocation Contrast In X-ray Synchrotron Topographs. Journal Of Applied Crystallography 10: 281-286.
  • Tanner BK (1977). Crystal Assessment By X-ray Topography Using Synchrotron Radiation. Progress In Crystal Growth And Characterization Of Materials 1: 23-56.
  • Corner, W.D. & Tanner, B.K. (1976). Magnetic domains. Physics Education 11: 356-362.
  • Tanner, B. K., Safa, M., Midgley, D. and Bordas, J. (1976). Observation of magnetic domain wall movements by X-ray topography using synchrotron radiation. Journal of Magnetism and Magnetic Materials 1: 337-341.
  • Tanner, B.K. (1976). LETTERS: Narrow-band model revisited. Physics Education 11: 452-453.
  • Tanner, B.K. (1976). The narrow-band model and semiconductor theory. Physics Education 11: 97-99.
  • Tanner BK & Smith SH (1975). X-ray Topographic Study Of Perfection Of Flux-grown Rare-earth Phosphates. Journal Of Crystal Growth 30: 323-326.
  • Wanklyn BM, Midgley D & Tanner BK (1975). Growth And Perfection Of Rare-earth Aluminate And Dyfeo3 Crystals With Moo3 As Additive. Journal Of Crystal Growth 29: 281-288.
  • Tanner BK & Smith SH (1975). Study Of Perfection Of Flux-grown Rare-earth Vanadates By X-ray Topography. Journal Of Crystal Growth 28: 77-84.
  • Safa M, Midgley D & Tanner BK (1975). Observation Of Antiferromagnetic Domains In Knif3 By X-ray Topography. Physica Status Solidi A-applied Research 28: K89-K91.
  • Corner, W.D. & Tanner, B.K. (1975). The easy direction of magnetization in gadolinium. Journal of Physics C Solid State Physics 9: 627-633.
  • Kamada K & Tanner BK (1974). Deformation Studies Of Initially Dislocation-free Copper Single-crystals1. Constant Strain-rate Tensile Test. Philosophical Magazine 29: 309-322.
  • Tanner BK (1974). Perfection Of Flux Grown Crystals. Journal Of Crystal Growth 24: 637-640.
  • Smith SH, Garton G & Tanner BK (1974). Top-seeded Flux Growth Of Rare-earth Vanadates. Journal Of Crystal Growth 23: 335-340.
  • Tanner BK & Fathers DJ (1974). Contrast Of Crystal Defects Under Polarized-light. Philosophical Magazine 29: 1081-1094.
  • Tanner BK (1973). X-ray Topographic Studies Of Dislocation Contrast In Silicon After Boron Diffusion. Journal Of Applied Crystallography 6: 31-38.
  • Tanner BK (1973). Dislocation-free Silver Single-crystals Grown By Czochralski Method. Zeitschrift Fur Naturforschung Section A-a Journal Of Physical Sciences A 28: 676-.
  • Fathers DJ & Tanner BK (1973). Line Defects In Barium-titanate Observed By Polarized-light Microscopy. Philosophical Magazine 28: 749-770.
  • Fathers DJ & Tanner BK (1973). Optical Contrast Of Inclined Boundaries In Birefringent Magnetic Materials. Philosophical Magazine 27: 17-34.
  • Tanner BK (1972). Dislocation Contrast In X-ray Topographs Of Very Thin Crystals. Physica Status Solidi A-applied Research 10: 381-.
  • Tanner BK (1972). X-ray And Optical Observations Of Natural Fluorite. Physica Status Solidi A-applied Research 14: K9-.
  • Tanner BK (1972). Perfection Of Czochralski Grown Copper Single-crystals. Journal Of Crystal Growth 16: 86-.
  • Rimmingt.hp, Balchin AA & Tanner BK (1972). Nearly Perfect Single-crystals Of Layer Compounds Grown By Iodine Vapor-transport Techniques. Journal Of Crystal Growth 15: 51-.
  • Parpia DY & Tanner BK (1971). Display Of X-ray Topographic Images Using A Channel Plate. Physica Status Solidi A-applied Research 6: 689-.
  • Tanner, B.K. & Humphreys, C.J. (1970). RESEARCH NOTES: High resolution divergent-beam X-ray topography. Journal of Physics D Applied Physics 3: 1144-1146.

Newspaper/Magazine Article

  • Tanner BK (2018). Spin-out, licence or collaborate: The Knowledge Transfer Dilemma. Magnews - The International Publication of the Magnetics Society (3): 24-27.